Al xps peak al-ch
is an excellent resource for analyzing XPS and Auger data. Kratos, the manufacturer of our Axis Supra +. It is available for Windows, Mac, and Linux operating systems.
AL XPS PEAK AL CH FOR FREE
The SESSA package can be downloaded for free on the NIST website. The simulated data can then be compared against the acquired data. You can specify the composition of your material, specify peak positions based on reference data from similar compounds, and the operating parameters of the spectrometer. Samples can be configured in multiple ways: Multilayers, Islands, wires, spheres on substrates. NIST’s Simulation of Electron Spectra for Surface Analysis (SESSA) is a great tool for simulating your AES XPS Spectra. The proposal was submitted by Professor Kristi Koski, and co-PIs Charles S Fadley, Coleman Kronawitter, Frank Osterloh and Jesus Velazquez. The Axis Supra is also equipped with a high tilt sample arm which can be used to acquire Angle-Resolved XPS (ARXPS).Īcquisition of the Axis Supra was funded by NSF-MRI 182838. Furthermore, the heat and cool holder allow the user to perform in-situ experiments in the sample analysis chamber. The SSS gives the user the in-situ capability of exposing samples to a variety of gas environments pre and post analysis without having to break vacuum.
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The Axis Supra is also equipped with a Minibeam 4, Ar+ ion gun designed for surface cleaning and relative depth profiling.Īn ultrahigh vacuum (UHV) Surface Science Station (SSS) is attached to the analysis chamber by a load lock. The Axis Supra is equipped with a Monchromated X-Ray Gun (Al and Ag anodes), an Achromatic X-Ray Gun (Al and Mg anodes), and Ultraviolet Photoelectron Spectroscopy (UPS) He lamp.Ī Hemispherical and Spherical mirror analyzer equipped with a 128 channel Delay-Line Detector allows for fast parallel imaging and excellent signal-to-noise.
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XPS is a surface sensitive technique, which allows the user to analyze the composition of their sample within the first 10nm of the surface. The Axis Supra is a X-Ray Photoelectron Spectrometer (XPS) manufactured by Kratos Analytical.